AN217 Datasheet | Philips Semiconductors

INTEGRATED CIRCUITS .. AN217 Metastability tests for the 74F786 - a 4-input asynchronous bus arbiter 1988 Jul 18 Philips Semiconductors Philips Semiconductors Application note Metastability tests for the 74F786 - 4-input asynchronous bus arbiter Authors: Charles Dike and Naseer Siddique INTRODUCTION Under contract with Signetics, Mr. Thomas J. Chaney of Washington University, St. Louis tested a set of nineteen 74F786 samples (packages) to determine the metastable state recovery statistics for the circuits. The tests were conducted using a procedure described in a paper entitled “Characterization and Scaling of MOS Flip-Flop Performance”, (section IV), by T. Chaney...