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AN217 - Metastability Tests

Key Features

  • st pin 13 12,11.
  • test pin 12 12,10.
  • test pin 12 11,10.
  • test pin 11 1988 Jul 18 4 Philips Semiconduct.

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INTEGRATED CIRCUITS www.DataSheet4U.com AN217 Metastability tests for the 74F786 – a 4-input asynchronous bus arbiter 1988 Jul 18 Philips Semiconductors Philips Semiconductors Application note Metastability tests for the 74F786 – 4-input asynchronous bus arbiter Authors: Charles Dike and Naseer Siddique INTRODUCTION Under contract with Signetics, Mr. Thomas J. Chaney of Washington University, St. Louis tested a set of nineteen 74F786 samples (packages) to determine the metastable state recovery statistics for the circuits. The tests were conducted using a procedure described in a paper entitled “Characterization and Scaling of MOS Flip-Flop Performance”, (section IV), by T. Chaney and F. Rosenberger, presented at the CalTech Conference on VLSI, January 1979.