• Part: ST25W08
  • Description: 8-Kbit Serial I2C Bus EEPROM
  • Category: EEPROM
  • Manufacturer: STMicroelectronics
  • Size: 125.54 KB
Download ST25W08 Datasheet PDF
STMicroelectronics
ST25W08
ST25W08 is 8-Kbit Serial I2C Bus EEPROM manufactured by STMicroelectronics.
- Part of the ST25C08 comparator family.
DESCRIPTION This specification covers a range of 8 Kbits I2C bus EEPROM products, the ST24/25C08 and the ST24/25W08. In the text, products are referred to as ST24/25x08, where "x" is: "C" for Standard version and "W" for Hardware Write Control version. E PRE SCL ST24x08 ST25x08 Table 1. Signal Names PRE E SDA SCL MODE WC VCC VSS Write Protect Enable Chip Enable Input Serial Data Address Input/Output Serial Clock Multibyte/Page Write Mode (C version) Write Control (W version) Supply Voltage Ground MODE/WC- AI00860E Note: WC signal is only available for ST24/25W08 products. February 1999 1/16 ST24/25C08, ST24/25W08 Figure 2A. DIP Pin Connections Figure 2B. SO Pin Connections ST24x08 ST25x08 PRE NC E VSS 1 2 3 4 8 7 6 5 AI00861E ST24x08 ST25x08 VCC MODE/WC SCL SDA PRE NC E VSS 1 2 3 4 8 7 6 5 AI01073E VCC MODE/WC SCL SDA Warning: NC = Not Connected. Warning: NC = Not Connected. Table 2. Absolute Maximum Ratings (1) Symbol TA TSTG TLEAD VIO VCC VESD Parameter Ambient Operating Temperature Storage Temperature Lead Temperature, Soldering Input or Output Voltages Supply Voltage Electrostatic Discharge Voltage (Human Body model) Electrostatic Discharge Voltage (Machine model) (3) (2) Value - 40 to 125 - 65 to 150 Unit °C °C °C V V V V (SO8 package) (PSDIP8 package) 40 sec 10 sec 215 260 - 0.6 to 6.5 - 0.3 to 6.5 4000 500 Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. 2. MIL-STD-883C, 3015.7 (100p F, 1500 Ω). 3. EIAJ IC-121 (Condition C) (200p F, 0 Ω). DESCRIPTION (...