• Part: EMIF04-2005QCF
  • Description: EMI FILTER
  • Manufacturer: STMicroelectronics
  • Size: 33.93 KB
Download EMIF04-2005QCF Datasheet PDF
STMicroelectronics
EMIF04-2005QCF
EMIF04-2005QCF is EMI FILTER manufactured by STMicroelectronics.
® EMI FILTER INCLUDING ESD PROTECTION IPAD.TM APPLICATIONS: Where EMI filtering in ESD sensitive equipment is required : puters and printer s munication systems s Mobile phones s DESCRIPTION The EMIF04-2005QCF is a highly integrated device designed to suppress EMI/RFI noise in all systems subjected to electromagnetic interferences. Additionally, the EMIF04-2005QCF filter includes an ESD protection circuitry which prevents destruction when subjected to ESD discharge up to 15k V. BENEFITS EMI symmetrical low-pass filter s Low PCB space consuming: 4 mm2 s s Very thin package < 1 mm s High reliability offered by monolithic integration QFN 2x2 mm 8 pins PIN CONFIGURATION Low-pass Filter Input Output Low-pass Filter Input Output PLIES WITH THE FOLLOWING STANDARDS: Low-pass Filter Input Output IEC61000-4-2: (air discharge) (contact discharge) MIL STD 883E - Method 3015-6 Class 3: 25k V (human body test) 15k V 8 k V Low-pass Filter Input Output BASIC CELL CONFIGURATION Low-pass Filter Input Output R = 200Ω C = 50p F max. TM : IPAD is a trademark of STMicroelectronics. December 2002 - Ed: 1A 1/4 ABSOLUTE RATINGS (Tamb = 25°C) Symbol VPP Tj Tstg Top TL ESD discharge Junction temperature Storage temperature range Operating temperature range Maximum lead temperature for soldering during 10s at 5mm from case Parameter and test conditions EC61000-4-2 air discharge IEC61000-4-2 contact discharge Value ± 15 ±8 125 -55 + 150 -40 to + 85 260 Unit k V °C °C °C °C ELECTRICAL CHARACTERISTICS (Tamb = 25 °C) Symbol VBR IRM VRM VCL IPP αT VF Parameter Breakdown voltage Leakage current @ VRM Stand-off voltage Clamping voltage Peak pulse current Voltage temperature coefficient Slope = 3/Rd VBR VCL VRM I IF VF IRM V Forward voltage drop Symbol VBR IRM Rd RI/O Cin @ 0V bias IR = 1 m A VRM = 3V per line Test conditions Min....