S-8233C Datasheet PDF - Seiko Instruments Battery Protection IC for 3-Serial Cell Pack Specs

S-8233C - Battery Protection IC for 3-Serial Cell Pack

Datasheet Summary

Description

Connects FET gate for discharge control (CMOS output) Non connect Connects FET gate for charge control (Nch open-drain output) Detects voltage between VCC to VMP(Over current detection pin) Connects capacitor for over current detection 1 delay circuit Connects capacitor for over discharge detection

Features

(1) Internal high-accuracy voltage detection circuit Over charge detection voltage 3.80 ± 0.05 V to 4.40 ± 0.05 V 5 mV - step Over charge release voltage 3.45 ± 0.10 V to 4.40 ± 0.10 V 5 mV - step (The over charge release voltage can be selected within the range where a difference from over charge detection voltage is 0 to 0.35 V at 50 mV - Step) Over discharge detection voltage 2.00 ± 0.08 V to 2.80± 0.08 V 50 mV - step Over discharge release voltage 2.00 ± 0.10 V to 4.00± 0.10 V 50 mV - step (.

Datasheet Details

Part number	S-8233C
Manufacturer	Seiko Instruments
File Size	568.47 KB
Description	Battery Protection IC for 3-Serial Cell Pack
Datasheet	S-8233C Datasheet
Additional preview pages of the S-8233C datasheet.

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Full PDF Text Transcription

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Rev.4.0_00 BATTERY PROTECTION IC FOR 3-SERIAL-CELL PACK S-8233C Series The S-8233C Series is a series of lithium-ion rechargeable battery protection ICs incorporating high-accuracy voltage detection circuits and delay circuits. The S-8233C series includes the function to measure the status of battery pack. It is suitable for a 3-serial-cell lithium-ion battery pack. Features (1) Internal high-accuracy voltage detection circuit Over charge detection voltage 3.80 ± 0.05 V to 4.40 ± 0.05 V 5 mV - step Over charge release voltage 3.45 ± 0.10 V to 4.40 ± 0.10 V 5 mV - step (The over charge release voltage can be selected within the range where a difference from over charge detection voltage is 0 to 0.35 V at 50 mV - Step) Over discharge detection voltage 2.00 ± 0.08 V to 2.80± 0.

Published: Oct 29, 2005 |