29SF020
29SF020 is SST29SF020 manufactured by Silicon Storage Technology.
FEATURES
:
- Organized as 256K x8 / 512K x8
- Single Voltage Read and Write Operations
- 4.5-5.5V for SST29SF020/040
- 2.7-3.6V for SST29VF020/040
- Superior Reliability
- Endurance: 100,000 Cycles (typical)
- Greater than 100 years Data Retention
- Low Power Consumption:
- Active Current: 10 m A (typical) ..
- Standby Current: 30 µA (typical) for SST29SF020/040 1 µA (typical) for SST29VF020/040
- Sector-Erase Capability
- Uniform 128 Byte sectors
- Fast Read Access Time:
- 55 ns for SST29SF020/040
- 70 ns for SST29VF020/040
- Latched Address and Data
- Fast Erase and Byte-Program:
- Sector-Erase Time: 18 ms (typical)
- Chip-Erase Time: 70 ms (typical)
- Byte-Program Time: 14 µs (typical)
- Chip Rewrite Time: 4 seconds (typical) for SST29SF/VF020 8 seconds (typical) for SST29SF/VF040
- Automatic Write Timing
- Internal VPP Generation
- End-of-Write Detection
- Toggle Bit
- Data# Polling
- TTL I/O patibility for SST29SF020/040
- CMOS I/O patibility for SST29VF020/040
- JEDEC Standard
- Flash EEPROM Pinouts and mand sets
- Packages Available
- 32-lead PLCC
- 32-lead TSOP (8mm x 14mm)
- All non-Pb (lead-free) devices are Ro HS pliant
PRODUCT DESCRIPTION
The SST29SF020/040 and SST29VF020/040 are 256K x8 / 512K x8 CMOS Small-Sector Flash (SSF) manufactured with SST’s proprietary, high-performance CMOS Super Flash technology. The split-gate cell design and thick-oxide tunneling injector attain better reliability and manufacturability pared with alternate approaches. The SST29SF020/040 devices write (Program or Erase) with a 4.5-5.5V power supply. The SST29VF020/040 devices write (Program or Erase) with a 2.7-3.6V power supply. These devices conform to JEDEC standard pin assignments for x8 memories. Featuring high performance Byte-Program, the SST29SF020/040 and SST29VF020/040 devices provide a maximum Byte-Program time of 20 µsec. To protect against inadvertent write, they have on-chip hardware and Software Data Protection schemes. Designed, manufactured, and tested for a...