SSS1004A7
SSS1004A7 is N-Channel enhancement mode power field effect transistors manufactured by Silikron Semiconductor.
Features and Benefits
TO-263-7L
- Advanced Process Technology
- Special designed for PWM, load switching and general purpose applications
- Ultra low on-resistance with low gate charge
- Fast switching and reverse body recovery
- 175℃ operating temperature
1, Gate 2~3,5~7 Source 4,8 Drain
Pin Assignment
Schematic diagram
Description
It utilizes the latest processing techniques to achieve the high cell density and reduces the on-resistance with high repetitive avalanche rating. These features bine to make this design an extremely efficient and reliable device for use in power switching application and a wide variety of other applications.
Absolute max Rating
Symbol ID @ TC = 25°C ID @ TC = 100°C IDM
PD @TC = 25°C
VDS VGS EAS IAS TJ TSTG
Parameter Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current ② Power Dissipation ③ Linear Derating Factor Drain-Source Voltage Gate-to-Source Voltage Single Pulse Avalanche Energy @ L=0.3m H Avalanche Current @ L=0.3m H Operating Junction and Storage Temperature Range
Max. 180 ① 130 ①
670 375 2.5 100 ± 20 1045 83.5 -55 to +175
Units
W W/°C
V V m J A °C
©Silikron Semiconductor CO.,LTD.
2014.04.18 .silikron.
Version : 1.2 page 1 of 7
Thermal Resistance
Symbol RθJC
RθJA
Characterizes Junction-to-case ③ Junction-to-ambient (t ≤ 10s) ④ Junction-to-Ambient (PCB mounted, steady-state) ④
Typ.
- -
- Max. 0.4 62 40
Units °C/W °C/W °C/W
Electrical Characterizes @TA=25℃ unless otherwise specified
Symbol V(BR)DSS RDS(on) VGS(th)
Parameter Drain-to-Source breakdown voltage Static Drain-to-Source on-resistance Gate threshold voltage
IDSS Drain-to-Source leakage current
IGSS Gate-to-Source forward leakage
Qg Total gate...