ILX585K Datasheet | Sony Semiconductor Solutions

Description φ φ φ φ φ φ φ φ φ φ φ φ Remended Supply Voltage Clock Characteristics φ φ φ φ φ φ φ φ φ φ φL1 φ φ φ Clock Frequency 2400 DPI Staggered φ φ φ φ φ φ φ φ φ φ φ φ Input Clock Pulse Voltage Condition φ φ φ φ φ φ φ SW mode Electrooptical Characteristics (Note 1, 2) (Ta=25c‚VDD=12V, ff RS=1MHz, Input clock=5Vp-p, Light source=3200K, IR cut filter CM500S (t = 1.0mm) σ Notes: 1. In accordance with the given electrooptical characteristics, the black level is defined as the average value of D40, D41 to D73. 2. For the sensitivity test light is applied with a uniform intensity of illumination. 3. PRNU us defubed as indicated below. Ray iincidence conditions are the same as for Note 2. Vout=500m V(typ.) PRNU = (VMAX - VMIN)/2 VAVE x 100 [%] 4. Use below the minimum value of the saturation output voltage. 5. Saturation exposure is defined as follows. SE = Where R indicates RR, RG, RB and SE indicates SER, SEG, SEB. 6. Optical signal accumulated time τ int stands at 4ms. 7. Supply current means the total current of this device. 8. Vos is defined as indicated bellow. VOUT indicates VOUT-R, VOUT-G, and VOUT-B. VOUT VOS GND 9. Random noise is defined on the output waveform with the external clamp and is defined as the standard deviation (sigma) of the output level difference between two adjacent effective pixels under no illumination (i.e.dark conditions) calculated by the following procedure. CCD output Output...