DESCRIPTION
Lamp test (LT), blanking (BI), and latch enable (LE) inputs are used to test the display, to turn-off or pulse modulate the brightness of the display, and to store a BCD code, respectively. It can be used with seven-segment light-emitting diodes (LED), incandescent, fluorescent, gas discharge, or liquid crystal readouts either directly or indirectly. APPLICATIONS
include instrument (e.g., counter, DVM, etc.) display driver, computer/calculator display driver, cockpit display driver, and various clock, watch, and timer uses. CMOS IC SOP-16 DIP-16 FEATURES
* Low Logic Circuit Power Dissipation * High–Current Sourcing Outputs (Up to 25 mA) * Latch Storage of Code * Blanking Input * Lamp Test Provision * Readout Blanking on all Illegal Input Combinations * Lamp Intensity Modulation Capability * Time Share (Multiplexing) Facility * Supply Voltage Range = 3.0 V ~ 18 V * Capable of Driving Two Low-power TTL Loads, One Low-power Schottky TTL Load or Two HTL Loads Over the Rated Temperature Range * Chip Complexity: 216 FETs or 54 Equivalent Gates * Triple Diode Protection on all Inputs UTC UNISONIC TECHNOLOGIES CO., LTD.