CC2640R2F-Q1
Overview
- Qualified for Automotive Applications
- AEC-Q100 Qualified With the Following Results: - Device Temperature Grade 2: -40°C to +105°C Ambient Operating Temperature Range - Device HBM ESD Classification Level 2 - Device CDM ESD Classification Level C3
- Microcontroller - Powerful ARM® Cortex®-M3 - EEMBC CoreMark® Score: 142 - Up to 48-MHz Clock Speed - 275-KB Nonvolatile Memory, Including 128-KB In-System Programmable Flash - Up to 28-KB System SRAM, of Which 20 KB is Ultra-Low-Leakage SRAM - 8-KB SRAM for Cache or System RAM Use - 2-Pin cJTAG and JTAG Debugging - Supports Over-the-Air Upgrade (OTA)
- Ultra-Low Power Sensor Controller - Can Run Autonomously From the Rest of the System - 16-Bit Architecture - 2-KB Ultra-Low Leakage SRAM for Code and Data
- Efficient Code Size Architecture, Placing Drivers, Bluetooth® low energy Controller, and Bootloader in ROM to Make More Flash Available for the Application
- RoHS-Compliant Automotive Grade Package - 7-mm × 7-mm RGZ VQFN48 With Wettable Flanks
- Peripherals - 31 GPIOs, All Digital Peripheral Pins Can Be Routed to Any GPIO - Four General-Purpose Timer Modules (Eight 16-Bit or Four 32-Bit Timers, PWM Each) - 12-Bit ADC, 200-ksamples/s, 8-Channel Analog MUX - Continuous Time Comparator - Ultra-Low Power Analog Comparator - Programmable Current Source - UART - 2× SSI (SPI, MICROWIRE, TI) - I2C, I2S - Real-Time Clock (RTC) - AES-128 Security Module 1 - True Random Number Generator (TRNG) - Support for Eight Capacitive-Sensing Buttons - Integrated Temperature Sensor
- External System - On-Chip Internal DC/DC Converter - Very Few External Components - Seamless Integration Wi
