ISO721M-EP
Overview
- 23 Controlled Baseline - One Assembly Site - One Test Site - One Fabrication Site
- Extended Temperature Performance of -55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree (1)
- 4000-V(peak) Isolation - UL 1577, IEC 60747-5-2 (VDE 0884, Rev. 2) IEC 61010-1 - 50-kV/µs Transient Immunity Typical (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
- Signaling Rate 0 Mbps to 150 Mbps - Low Propagation Delay - Low Pulse Skew (Pulse-Width Distortion)
- Low-Power Sleep Mode
- High Electromagnetic Immunity
- Low Input Current Requirement
