LM98640QML-SP Datasheet | Texas Instruments

Features - 1 Radiation Hardened - TID 100 krad(Si) - Single Event Latch-Up (SEL) Immune to LET = 120 Me V-cm2/mg - Single Event Functional Interrupt (SEFI) Free to 120 Me V-cm2/mg - SMD 5962R1820301VXC - ADC Resolution: 14-Bit - ADC Sampling Rate: 5 MSPS to 40 MSPS - Input Level: 2.85 V - Supply Voltages 3.3 V and 1.8 V (Nominal) - 125 m W per Channel at 15 MSPS - 178 m W per Channel at 40 MSPS - CDS or S/H Processing for CCD or CIS Sensors - CDS or S/H Gain 0 d B or 6 d B - Programmable Analog Gain for Each Channel - 256 Steps; Range - 3 d B to 18 d B - Programmable Analog Offset Correction - Fine and Coarse DAC Resolution ±8 Bits - Fine DAC Range ±5 m V - Coarse DAC Range ±250 m V - Programmable Input Clamp Voltage - Programmable Sample Edge: 1/64th Pixel Period - INL at 15 MHz: ±3.5 LSB - Noise Floor: - 79 d B - Crosstalk: - 80 d B - Operating Temp: - 55°C to 125°C VSS33 VDD33 V1 VREFT1 VREFB1 IBIAS VREFBG VDD18 VSS18 INCLK+ INCLK- OS1OS1+ VCLP OS2+ OS2- CDAC1[ COARSE 8:0] 9 DAC FDAC1[ 8:0] 9 FINE...