Texas Instruments SCAN921226H
The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.| Part No. | SCAN921226H |
|---|---|
| Datasheet | SCAN921226H Download |
| Manufacturer |  Texas Instruments |
| Description | High Temperature 20-80 MHz 10-Bit Bus LVDS SerDes |
| Buy | Stock & Price |
FEATURES
1●2 High Temperature Operation to 125°C
● IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
● Clock Recovery from PLL Lock to Random Data Patterns
● Ensured Transition Every Data Transfer Cycle
● Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
● Single Differential Pair Eliminates Multi- Channel Skew
● 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
● 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
● Synchronization Mode and LOCK Indicator
● Programmable Edge Trigger on Clock
● High Impedance on Receiver Inputs When Power is Off
● Bus LVDS Serial Output Rated for 27Ω Load
● Small 49-Lead NFBGA Package
APPLICATIONS
● Automotive● Industrial
● Military/Aerospace
DESCRIPTION
The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity.
