SN54ABT18245 datasheet by Texas Instruments.
| Part number | SN54ABT18245 |
|---|---|
| Datasheet | SN54ABT18245-etcTI.pdf |
| File Size | 410.47 KB |
| Manufacturer | Texas Instruments |
| Description | SCAN TEST DEVICE |
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The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN54ABT18245A | SCAN TEST DEVICES |
| SN54ABT18502 | SCAN TEST DEVICE |
| SN54ABT18504 | SCAN TEST DEVICE |
| SN54ABT18640 | SCAN TEST DEVICE |
| SN54ABT125 | QUADRUPLE BUS BUFFER GATES |
| SN54ABT126 | QUADRUPLE BUS BUFFER GATES |
| SN54ABT162244 | 16-BIT BUFFERS/DRIVERS |
| SN54ABT162245 | 16-Bit BUS TRANSCEIVERS |
| SN54ABT16240A | 16-BIT BUFFERS/DRIVERS |
| SN54ABT16241A | 16-BIT BUFFERS/DRIVERS |
