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SN54ABT18245 - SCAN TEST DEVICE

Description

The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Note: The manufacturer provides a single datasheet file (SN54ABT18245-etcTI.pdf) that lists specifications for multiple related part numbers.

Datasheet Details

Part number SN54ABT18245
Manufacturer Texas Instruments
File Size 410.47 KB
Description SCAN TEST DEVICE
Datasheet download datasheet SN54ABT18245 Datasheet
Additional preview pages of the SN54ABT18245 datasheet.

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Full PDF Text Transcription

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SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A – AUGUST 1994 – REVISED JANUARY 1995 • Member of the Texas Instruments SCOPE ™ Family of Testability Products • Member of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • SCOPE ™ Instruction Set – IEEE Standard 1149.
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