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SN54ABT18502 - SCAN TEST DEVICE

Description

The SN54ABT18502 scan test device with 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE™ testability integrated circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Datasheet Details

Part number SN54ABT18502
Manufacturer Texas Instruments
File Size 590.87 KB
Description SCAN TEST DEVICE
Datasheet download datasheet SN54ABT18502 Datasheet
Additional preview pages of the SN54ABT18502 datasheet.

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Full PDF Text Transcription

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• Member of the Texas Instruments SCOPE ™ Family of Testability Products • Member of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode • Two Boundary-Scan Cells per I/O for Greater Flexibility • State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design Significantly Reduces Power Dissipation SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS109C – AUGUST 1992 – REVISED AUGUST 1994 • SCOPE ™ Instruction Set – IEEE Standard 1149.
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