Datasheet Details
| Part number | SN54ABT18640 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 552.32 KB |
| Description | SCAN TEST DEVICE |
| Download | SN54ABT18640 Download (PDF) |
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| Part number | SN54ABT18640 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 552.32 KB |
| Description | SCAN TEST DEVICE |
| Download | SN54ABT18640 Download (PDF) |
|
|
|
The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.
| Part Number | Description |
|---|---|
| SN54ABT18245 | SCAN TEST DEVICE |
| SN54ABT18245A | SCAN TEST DEVICES |
| SN54ABT18502 | SCAN TEST DEVICE |
| SN54ABT18504 | SCAN TEST DEVICE |
| SN54ABT125 | QUADRUPLE BUS BUFFER GATES |
| SN54ABT126 | QUADRUPLE BUS BUFFER GATES |
| SN54ABT162244 | 16-BIT BUFFERS/DRIVERS |
| SN54ABT162245 | 16-Bit BUS TRANSCEIVERS |
| SN54ABT16240A | 16-BIT BUFFERS/DRIVERS |
| SN54ABT16241A | 16-BIT BUFFERS/DRIVERS |