SN54ABT8245 Description
The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.