SN54ABT8245
SN54ABT8245 is SCAN TEST DEVICES manufactured by Texas Instruments.
description
The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
SN54ABT8245 . . . JT PACKAGE SN74ABT8245 . . . DW PACKAGE
(TOP VIEW)
DIR 1 B1 2 B2 3 B3 4 B4 5
GND 6 B5 7 B6 8 B7 9 B8 10
TDO 11 TMS 12
24 OE 23 A1 22 A2 21 A3 20 A4 19 A5 18 VCC 17 A6 16 A7 15 A8 14 TDI 13 TCK
SN54ABT8245 . . . FK PACKAGE (TOP VIEW)
A3 A4 A5 NC V CC A6 A7
4 3 2 1 28 27 26
A2 5
25 A8
A1 6
24 TDI
OE 7
23 TCK
NC 8
22 NC
DIR 9
21 TMS
B1 10
20 TDO
B2 11
19 B8
12 13 14 15 16 17 18
B3 B4 GND NC B5 B6 B7
- No internal connection
In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE ™ octal bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard...
