SN54ABT8245 - SCAN TEST DEVICES

Description

The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

Texas Instruments

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Datasheet Details

Part number	SN54ABT8245
Manufacturer	Texas Instruments
File Size	1.11 MB
Description	SCAN TEST DEVICES
Datasheet	SN54ABT8245 Datasheet
Additional preview pages of the SN54ABT8245 datasheet.

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Full PDF Text Transcription

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SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode D SCOPE ™ Instruction Set: – IEEE Standard 1149.

Published: May 20, 2023 |