Download the SN54ABTH182646A datasheet PDF. This datasheet also covers the SN54ABTH18646A variant, as both devices belong to the same scan test devices family and are provided as variant models within a single manufacturer datasheet.
The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.
| Part number | SN54ABTH182646A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 883.32 KB |
| Description | SCAN TEST DEVICES |
| Datasheet |
 SN54ABTH182646A Datasheet
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| Part Number | Description | Manufacturer |
|---|---|---|
| SN54HC595J | 16-bit bus transceiver and transparant D-type latch | nexperia |
| SN54LS00 | QUAD 2-INPUT NAND GATE | Motorola Inc |
| SN54LS01 | QUAD 2-INPUT NAND GATE | Motorola Inc |
| SN54LS02 | QUAD 2-INPUT NOR GATE | Motorola Inc |
| SN54LS03 | QUAD 2-INPUT NAND GATE | Motorola Inc |
| Part Number | Description |
|---|---|
| SN54ABTH182652A | SCAN TEST DEVICES |
| SN54ABTH182502A | SCAN TEST DEVICES |
| SN54ABTH182504A | SCAN TEST DEVICES |
| SN54ABTH18502A | SCAN TEST DEVICES |
| SN54ABTH18504A | SCAN TEST DEVICES |
The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.
