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SN54ACT8997 Datasheet Scan-path Linkers

Manufacturer: Texas Instruments

Overview: SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus D Allow Partitioning of System Scan Paths D Can Be Cascaded Horizontally or Vertically D Select Up to Four Secondary Scan Paths to Be Included in a Primary Scan Path D Include 8-Bit Programmable Binary Counter to Count or Initiate Interrupt Signals D Include 4-Bit Identification Bus for Scan-Path Identification D Inputs Are TTL Compatible D EPIC ™ (Enhanced-Performance Implanted CMOS) 1-µm Process D Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs SN54ACT8997 . . . JT PACKAGE SN74ACT8997 . . . DW OR NT PACKAGE (TOP VIEW) DCO 1 MCO 2 DTDO1 3 DTDO2 4 DTDO3 5 DTDO4 6 GND 7 DTMS1 8 DTMS2 9 DTMS3 10 DTMS4 11 DTCK 12 TDO 13 TMS 14 28 DCI 27 MCI 26 TRST 25 ID1 24 ID2 23 ID3 22 ID4 21 VCC 20 DTDI1 19 DTDI2 18 DTDI3 17 DTDI4 16 TDI 15 TCK SN54ACT8997 . . .

General Description

The ’ACT8997 are members of the Texas Instruments SCOPE™ testability integratedcircuit family.

This family of components facilitates testing of complex circuit-board assemblies.

The ’ACT8997 enhance the scan capability of TI’s SCOPE™ family by allowing augmentation of a system’s primary scan path with secondary scan paths (SSPs), which can be individually selected by the ’ACT8997 for inclusion in the primary scan path.

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