SN54LVT18502 Overview
Key Features
- IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
| Part | SN54LVT18502 |
|---|---|
| Description | 3.3-V ABT SCAN TEST DEVICE |
| Manufacturer | Texas Instruments |
| Size | 479.77 KB |
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