SN54LVT18502
SN54LVT18502 is 3.3-V ABT SCAN TEST DEVICE manufactured by Texas Instruments.
description
The SN54LVT18502 scan test device with 18-bit universal bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
Additionally, this...
