SN54LVT18502 datasheet by Texas Instruments.
| Part number | SN54LVT18502 |
|---|---|
| Datasheet | SN54LVT18502-etcTI.pdf |
| File Size | 479.77 KB |
| Manufacturer | Texas Instruments |
| Description | 3.3-V ABT SCAN TEST DEVICE |
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The SN54LVT18502 scan test device with 18-bit universal bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN54LVT18512 | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVT182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVT162240 | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN54LVT162244A | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN54LVT162245A | 3.3-V ABT 16-BIT BUS TRANSCEIVERS |
| SN54LVT16240 | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN54LVT16244B | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN54LVT16245A | 3.3-V ABT 16-BIT BUS TRANSCEIVERS |
| SN54LVT16245B | 3.3-V ABT 16-BIT BUS TRANSCEIVERS |
| SN54LVT16501 | 3.3-V ABT 18-BIT UNIVERSAL BUS TRANSCEIVERS |
