Datasheet Details
| Part number | SN74ABT8646 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 693.00 KB |
| Description | SCAN TEST DEVICES |
| Datasheet | SN74ABT8646-etcTI.pdf |
|
|
Overview: SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode D SCOPE Instruction Set − IEEE Standard 1149.
| Part number | SN74ABT8646 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 693.00 KB |
| Description | SCAN TEST DEVICES |
| Datasheet | SN74ABT8646-etcTI.pdf |
|
|
|
The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
Compare SN74ABT8646 distributor prices and check real-time stock availability from major suppliers. Prices and inventory may vary by region and order quantity.
| Part Number | Description |
|---|---|
| SN74ABT861 | 10-BIT TRANSCEIVERS |
| SN74ABT863 | 9-BIT BUS TRANSCEIVERS |
| SN74ABT8652 | SCAN TEST DEVICES |
| SN74ABT821A | 10-BIT BUS-INTERFACE FLIP-FLOPS |
| SN74ABT823 | 9-BIT BUS-INTERFACE FLIP-FLOPS |
| SN74ABT8245 | SCAN TEST DEVICES |
| SN74ABT827 | 10-Bit Buffer/Drivers |
| SN74ABT833 | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
| SN74ABT841A | 10-BIT BUS-INTERFACE D-TYPE LATCHES |
| SN74ABT843 | 9-BIT BUS-INTERFACE D-TYPE LATCHES |