SN74ABT8652
SN74ABT8652 is SCAN TEST DEVICES manufactured by Texas Instruments.
description
The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
A2 A3 GND A4 A5 A6 A7
SN54ABT8652 . . . JT PACKAGE SN74ABT8652 . . . DL OR DW PACKAGE
(TOP VIEW)
CLKAB 1 SAB 2
OEAB 3 A1 4 A2 5 A3 6
GND 7 A4 8 A5 9 A6 10 A7 11 A8 12
TDO 13 TMS 14
28 CLKBA 27 SBA 26 OEBA 25 B1 24 B2 23 B3 22 B4 21 VCC 20 B5 19 B6 18 B7 17 B8 16 TDI 15 TCK
SN54ABT8652 . . . FK PACKAGE (TOP VIEW)
B1 B2 B3 B4 V CC B5 B6
OEBA SBA
CLKBA CLKAB
SAB OEAB
A1
4 3 2 1 28 27 26
12 13 14 15 16 17 18
B7 B8 TDI TCK TMS TDO A8
In the normal mode, these devices are functionally equivalent to the ’F652 and ’ABT652 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE™ octal bus transceivers and registers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products pliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products,...
