Datasheet Details
| Part number | SN74ABT8652 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 618.11 KB |
| Description | SCAN TEST DEVICES |
| Datasheet | SN74ABT8652-etcTI.pdf |
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Overview: SN54ABT8652, SN74ABT8652 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F652 and ’ABT652 in the Normal-Function Mode D SCOPE ™ Instruction Set – IEEE Standard 1149.
| Part number | SN74ABT8652 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 618.11 KB |
| Description | SCAN TEST DEVICES |
| Datasheet | SN74ABT8652-etcTI.pdf |
|
|
|
The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
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| SN74ABT823 | 9-BIT BUS-INTERFACE FLIP-FLOPS |
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| SN74ABT827 | 10-Bit Buffer/Drivers |
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| SN74ABT843 | 9-BIT BUS-INTERFACE D-TYPE LATCHES |