Datasheet Details
| Part number | SN74AHC08-EP |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 680.77 KB |
| Description | Quadruple 2-Input Positive-AND Gate |
| Download | SN74AHC08-EP Download (PDF) |
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| Part number | SN74AHC08-EP |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 680.77 KB |
| Description | Quadruple 2-Input Positive-AND Gate |
| Download | SN74AHC08-EP Download (PDF) |
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/ordering information This device is a quadruple 2-input positive-AND gate that performs the Boolean function + + ) Y A • B or Y A B in positive logic.
ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING –55°C to 125°C SOIC – D TSSOP – PW Tape and reel Tape and reel SN74AHC08MDREP SN74AHC08MPWREP AHC08MEP AHC08EP ‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package.
FUNCTION TABLE (each gate) INPUTS A B OUTPUT Y H H H L X L X L L Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SN74AHC08-EP QUADRUPLE 2-INPUT POSITIVE-AND GATE D Controlled Baseline – One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of –55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Operating Range 2-V to 5.5-V VCC D EPIC (Enhanced-Performance Implanted CMOS) Process D Latch-Up Performance Exceeds 250 mA Per JESD 17 D ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
| Part Number | Description |
|---|---|
| SN74AHC08 | Quadruple 2-Input Positive-AND Gate |
| SN74AHC08D | Quadruple 2-Input Positive-AND Gate |
| SN74AHC08N | Quadruple 2-Input Positive-AND Gate |
| SN74AHC08Q-Q1 | Quadruple 2-Input Positive-AND Gate |
| SN74AHC00 | Quadruple 2-Input Positive-NAND Gates |
| SN74AHC00-EP | QUADRUPLE 2-INPUT POSITIVE-NAND GATE |
| SN74AHC00-Q1 | QUADRUPLE 2-INPUT POSITIVE-NAND GATE |
| SN74AHC02 | QUADRUPLE 2-INPUT POSITIVE-NOR GATE |
| SN74AHC02-EP | QUADRUPLE 2-INPUT POSITIVE-NOR GATE |
| SN74AHC02-Q1 | Automotive Quadruple 2-Input Positive-NOR Gates |