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SN74AHCT00-EP Datasheet Quadruple 2-input Positive-nand Gates

Manufacturer: Texas Instruments

Overview: SN74AHCT00ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆNAND GATES D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Inputs Are TTL-Voltage patible † ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits.

General Description

/ordering information The ’AHCT00 device performs the Boolean function Y = A • B or Y = A + B in positive logic.

ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING −55°C to 125°C SOIC − D TSSOP − PW Tape and reel Tape and reel SN74AHCT00MDREP AHCT00MEP SN74AHCT00MPWREP AHT00EP ‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at .ti./sc/package.

FUNCTION TABLE (each gate) INPUTS A B OUTPUT Y H H L L X H X L H logic diagram, each gate (positive logic) A Y B Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

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