SN74AHCT00-EP Datasheet | Texas Instruments

SN74AHCT00ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆNAND GATES D Controlled Baseline - One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of - 55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Inputs Are TTL-Voltage patible † ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such...