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SN74HC10-Q1 - TRIPLE 3-INPUT POSITIVE-NAND GATE

General Description

This device contains three independent 3-input NAND gates.

B

C in positive logic.

Key Features

  • 1 AEC-Q100 Qualified for automotive.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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Product Folder Order Now Technical Documents Tools & Software Support & Community SN74HC10-Q1 SCLS531B – AUGUST 2003 – REVISED APRIL 2020 SN74HC10-Q1 Automotive Triple 3-Input NAND Gates 1 Features •1 AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compared to LSTTL logic ICs 2 Applications • Alarm / tamper detect circuit • S-R latch 3 Description This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A ● B ● C in positive logic.