SN74LVC1G06-EP
FEATURES
- Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
- Extended Temperature Performance of
- 55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree (1)
- Available in the Texas Instruments Nano Star™ and Nano Free™ Packages
- Supports 5-V VCC Operation
- Input and Open-Drain Output Accept
(1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits.
Voltages up to 5.5 V
- Max tpd of 4 ns at 3.3 V
- Low Power Consumption, 10-μA Max ICC
- ±24-m A Output Drive at...
