SN74LVT18512 datasheet by Texas Instruments.
| Part number | SN74LVT18512 |
|---|---|
| Datasheet | SN74LVT18512-etcTI.pdf |
| File Size | 959.03 KB |
| Manufacturer | Texas Instruments |
| Description | 3.3-V ABT SCAN TEST DEVICES |
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The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN74LVT182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVT125 | 3.3-V ABT QUADRUPLE BUS BUFFERS |
| SN74LVT125-EP | 3.3-V ABT QUADRUPLE BUS BUFFERS |
| SN74LVT125-Q1 | 3.3-V ABT QUADRUPLE BUS BUFFERS |
| SN74LVT162240 | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN74LVT162244A | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN74LVT162245A | 3.3-V ABT 16-BIT BUS TRANSCEIVERS |
| SN74LVT16240 | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN74LVT16244B | 3.3-V ABT 16-BIT BUFFERS/DRIVERS |
| SN74LVT16245A | 3.3-V ABT 16-BIT BUS TRANSCEIVERS |
