SN74LVT8986 Overview
/ORDERING INFORMATION The 'LVT8986 linking addressable scan ports (LASPs) are members of the TI family of IEEE Std 1149.1 (JTAG) scan-support products. The scan-support product family facilitates testing of fully boundary-scannable devices. The LASP applies linking shadow protocols through the test access port (TAP) to extend scan access to the system level and divide scan chains at the board level.
SN74LVT8986 Key Features
- Members of the Texas Instruments (TI) Family of JTAG Scan-Support Products
- Extend Scan Access From Board Level to Higher Level of System Integration
- Three IEEE Std 1149.1-patible Configurable Secondary Scan Paths to One Primary Scan Path
- Multiple Devices Can Be Cascaded to Link 24 Secondary Scan Paths to One Primary Scan Path
- Simple (Linking Shadow) Protocol Is Used to Connect the Primary Test Access Port (TAP) to Secondary TAPs. This Single Pr
- LASP (8986) and ASP (8996) Can Be Configured on the Same Backplane Using Similar Shadow Protocols
- Linking Shadow Protocols Can Occur in Any of Test Logic Reset, Run Test/Idle, Pause DR, Pause IR TAP States to Provide B
- Bypass (BYP5-BYP0) Forces Primary to Configured Secondary Paths Without Use of Linking Shadow Protocols
- Connect (CON2-CON0) Provides Indication of Primary-to-Secondary Paths Connections
- Secondary TAPs Can Be Configured at High Impedance Via the OE Input to Allow an Alternate Test Master to Take Control of