| Part | SN74LVTH182652A |
|---|---|
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Manufacturer | Texas Instruments |
| Size | 888.40 KB |
Package: LQFP
Mount Type: Surface Mount
Pins: 64
Max Voltage (typical range): 3.6 V
The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.
| Seller | Inventory | Price Breaks | Buy |
|---|---|---|---|
| Rochester Electronics | 3152 | 25+ : 12.84 USD 100+ : 12.2 USD 500+ : 11.56 USD 1000+ : 10.91 USD |
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| Verical | 1760 | 25+ : 16.05 USD 100+ : 15.25 USD 500+ : 14.45 USD 1000+ : 13.6375 USD |
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