SN74LVTH18504A - 3.3-V ABT SCAN TEST DEVICES

Description

The ’LVTH18504A and ’LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.

Texas Instruments

📥 Download Datasheet

Datasheet Details

Part number	SN74LVTH18504A
Manufacturer	Texas Instruments
File Size	858.30 KB
Description	3.3-V ABT SCAN TEST DEVICES
Datasheet	SN74LVTH18504A Datasheet

📁 Similar Datasheet

SN74LVC1G125 - high performance non-inverting buffer (UMW)
SN74LVC1G34 - Single buffer (UMW)
SN74L71 - AND-Gate R-S Master-Slave F-F (National Semiconductor)
SN74L74N - Dual D-Type Flip-Flop (ETC)
SN74LS00 - QUAD 2-INPUT NAND GATE (Motorola)
SN74LS00 - Quad 2-Input NAND Gate (ON Semiconductor)
SN74LS02 - QUAD 2-INPUT NOR GATE (Motorola)
SN74LS02 - QUAD 2-INPUT NOR GATE (ON Semiconductor)
SN74LS04 - Hex Inverter (ON Semiconductor)
SN74LS04 - HEX INVERTER (Motorola)

Other Datasheets by Texas Instruments

SN74LVTH18502A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18512 - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182502A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182504A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182512 - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182646A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182652A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18646A - 3.3-V ABT SCAN TEST DEVICES

Full PDF Text Transcription

Click to expand full text

SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B – JULY 1996 – REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.

Published: Feb 6, 2025 |