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SN74LVTH18512 - 3.3-V ABT SCAN TEST DEVICES

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Part number SN74LVTH18512
Manufacturer Texas Instruments
File Size 683.44 KB
Description 3.3-V ABT SCAN TEST DEVICES
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Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

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