SN74LVTH18512 datasheet by Texas Instruments.
| Part number | SN74LVTH18512 |
|---|---|
| Datasheet | SN74LVTH18512-etcTI.pdf |
| File Size | 683.44 KB |
| Manufacturer | Texas Instruments |
| Description | 3.3-V ABT SCAN TEST DEVICES |
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The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN74LVTH18502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH125 | 3.3-V ABT QUADRUPLE BUS BUFFER |
