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SN74LVTH18646A - 3.3-V ABT SCAN TEST DEVICES

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Part number SN74LVTH18646A
Manufacturer Texas Instruments
File Size 885.34 KB
Description 3.3-V ABT SCAN TEST DEVICES
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Description

The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.

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