| Part | SN74LVTH18646A |
|---|---|
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Manufacturer | Texas Instruments |
| Size | 885.34 KB |
Package: LQFP
Mount Type: Surface Mount
Pins: 64
Operating Voltage: 3.3 V
The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.
| Seller | Inventory | Price Breaks | Buy |
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| Rochester Electronics | 5298 | 25+ : 12.84 USD 100+ : 12.2 USD 500+ : 11.56 USD 1000+ : 10.91 USD |
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