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SN74LVTH18652A Datasheet 3.3-v Abt Scan Test Devices

Manufacturer: Texas Instruments

Overview: SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS312C – MARCH 1994 – REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors D B-Port Outputs of ’LVTH182652A Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required D patible With the IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.

General Description

The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies.

Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.

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