| Part | SN74LVTH18652A |
|---|---|
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Manufacturer | Texas Instruments |
| Size | 888.40 KB |
Package: LQFP
Mount Type: Surface Mount
Pins: 64
Operating Voltage: 3.3 V
The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.
| Seller | Inventory | Price Breaks | Buy |
|---|---|---|---|
| Rochester Electronics | 2345 | 25+ : 11.17 USD 100+ : 10.61 USD 500+ : 10.05 USD 1000+ : 9.49 USD |
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