SN74LVTH18652A datasheet by Texas Instruments.
| Part number | SN74LVTH18652A |
|---|---|
| Datasheet | SN74LVTH18652A-etcTI.pdf |
| File Size | 888.40 KB |
| Manufacturer | Texas Instruments |
| Description | 3.3-V ABT SCAN TEST DEVICES |
|
|
The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN74LVTH18646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH125 | 3.3-V ABT QUADRUPLE BUS BUFFER |
