SN74LVTH32373-EP Datasheet | Texas Instruments

SN74LVTH32373ĆEP 3.3ĆV ABT 32ĆBIT TRANSPARENT DĆTYPE LATCH WITH 3ĆSTATE OUTPUTS SCBS794 - DECEMBER 2003 D Controlled Baseline - One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Member of the Texas Instruments Widebus+  Family D State-of-the-Art Advanced BiCMOS Technology (ABT) Design for 3.3-V Operation and Low Static-Power Dissipation † ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85,...