SN75LBC241
SN75LBC241 is MULTIPLE DRIVERS AND RECEIVERS manufactured by Texas Instruments.
description
The SN75LBC241 is a low-power Lin Bi CMOS line-interface device containing four independent drivers and five receivers. It is designed as a plug-in replacement for the Maxim MAX241. The SN75LBC241 provides a capacitive-charge-pump voltage generator to produce RS-232 voltage levels from a 5-V supply. The charge-pump oscillator frequency is 20 k Hz. Each receiver converts RS-232 inputs to 5-V TTL/CMOS levels. The receivers have a typical threshold of 1.2 V and a typical hysteresis of 0.5 V and can accept ±30-V inputs. Each driver converts TTL/CMOS input levels into RS-232 levels.
The SN75LBC241 includes a receiver, a 3-state control line, and a low-power shutdown control line. When the EN line is high, receiver outputs are placed in the high-impedance state. When EN is low, normal operation is enabled.
The shutdown mode reduces power dissipation to less than 5 µW, typically. In this mode, receiver outputs have high impedance, driver outputs are turned off, and the charge-pump circuit is turned off. When SHUTDOWN is high, the shutdown mode is enabled. When SHUTDOWN is low, normal operation is enabled.
This device has been designed to conform to TIA/EIA-232-F and ITU Remendation V.28.
The SN75LBC241 has been designed using Lin Bi CMOS technology and cells contained in the Texas Instruments Lin ASIC library. Use of Lin Bi CMOS circuitry increases latch-up immunity in this device over an all-CMOS design.
The SN75LBC241 is characterized for operation from 0°C to 70°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Lin Bi CMOS and Lin ASIC are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all...