TLC2543-EP Datasheet | Texas Instruments

.ti. TLC2543-EP 12-BIT ANALOG-TO-DIGITAL CONVERTER WITH SERIAL CONTROL AND 11 ANALOG INPUTS SGLS125A - JULY 2002 - REVISED NOVEMBER 2006 Features - Controlled Baseline - One Assembly/Test Site, One Fabrication Site - Extended Temperature Performance of - 40°C to 125°C (TLC2543Q) and - 55°C to 125°C (TLC2543M) - Enhanced Diminishing Manufacturing Sources (DMS) Support - Enhanced Product Change Notification - Qualification Pedigree (1) - 12-Bit-Resolution Analog-to-Digital Converter (ADC) - 10-µs Conversion Time Over Operating Temperature - 11 Analog Input Channels - Three Built-In Self-Test Modes - Inherent Sample-and-Hold Function - Linearity Error . . . ±1 LSB Max - On-Chip System Clock - End-of-Conversion (EOC) Output - Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference) - Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First (1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits. - Programmable Power Down - Programmable Output Data Length - CMOS Technology - Application Report Available (2) DW PACKAGE (TOP...