TLV3011-EP Datasheet | Texas Instruments

FEATURES - Controlled Baseline - One Assembly/Test Site - One Fabrication Site - Extended Temperature Performance of - 55°C to 125°C - Enhanced Diminishing Manufacturing Sources (DMS) Support - Enhanced Product-Change Notification - Qualification Pedigree(1) - Low Quiescent Current = 5 µA (Max) - Integrated Voltage Reference = 1.242 V - Input mon-Mode Range = 200 m V Beyond Rails - Voltage Reference Initial Accuracy = 1% - Open-Drain Logic patible Output (TLV3011) - Push-Pull Output (TLV3012) - Low Supply Voltage = 1.8 V to 5.5 V - Fast Response Time = 6-µs Propagation Delay With 100-m V Overdrive (TLV3011: RPULLUP = 10 kΩ) - Microsize Package: SOT23-6 (1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life....