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74HC74-Q100 - Dual D-type flip-flop

General Description

The 74HC74-Q100; 74HCT74-Q100 are dual positive edge triggered D-type flip-flop with individual data (nD), clock (nCP), set (nSD) and reset (nRD) inputs, and complementary nQ and nQ outputs.

Key Features

  • Automotive product qualification in accordance with AEC-Q100 (Grade 1).
  • Specified from -40 °C to +85 °C and from -40 °C to +125 °C.
  • Input levels:.
  • For 74HC74-Q100: CMOS level.
  • For 74HCT74-Q100: TTL level.
  • Symmetrical output impedance.
  • Low power dissipation.
  • High noise immunity.
  • Balanced propagation delays.
  • Specified in compliance with JEDEC standard no. 7A.
  • ESD protection:.
  • MIL-STD-883, m.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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74HC74-Q100; 74HCT74-Q100 Dual D-type flip-flop with set and reset; positive edge-trigger Rev. 4 — 21 April 2020 Product data sheet 1. General description The 74HC74-Q100; 74HCT74-Q100 are dual positive edge triggered D-type flip-flop with individual data (nD), clock (nCP), set (nSD) and reset (nRD) inputs, and complementary nQ and nQ outputs. Data at the nD-input, that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition, will be stored in the flip-flop and appear at the nQ output. The Schmitt-trigger action in the clock input, makes the circuit highly tolerant to slower clock rise and fall times. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.