Description
Input HIGH Voltage Input LOW Voltage Input Current Output Leakage Current Clock Leakage Current Output HIGH Voltage D~iving TTL, Output HIGH Voltage Driving MOS Output HIGH Voltage Driving TTL Output HIGH Voltage Driving MOS Output LOW Voltage Clock Input HIGH Level Clock I nput LOW Level VOO Current, VOO = -5 V ±5% VOO Current, VOO = -5V ±5% VOO Current, VOO = -9V ±5% Test Conditions TA=25°C T A = 25°C, VOUT = OV TA = 25°C, Vet> = -12V R,L = 3k to VOO, VOO = -5V ±5% RL = 4,7k to VOO, VOO = -5V ±5% RL = 4.7k to VOO, VOO = -9V ±5% RL = 6.2k to VOO, 3.9k to Vce VOO = -9V ±5% VOO = -5V±5%, RL,= 3k to VOO, IOL = -1.6rnA RL = 4.7k to VOO VOO =-9V ±5%,IOL = -1.6rnA VOO = -5V ±5% VOO = -9V ±5% 5 MHz Data Rate 33% Duty eyc'le Vet>L = VCC-17V TA = 25°C TA = O°C TA = _55°e 10MHz Data Rate 40% Duty Cycle Vet>L = VCC-17 TA = 25°C TA = O°C TA =_55°C 3MHz Data Rate TA = 25°C 26% Duty Cycle TA = O°C Vet>L = VCC-14.7V TA = _55°C Am1402A, 3A, 4A Min. V e e -2 .O Vce- 1O VCC-4 - 2 <10 500.
