GET-30569 Description
This report presents the qual ification test results-on-NE272 series. 2/8 1.Test -- Device NE272 AI GaAs /In GaAs hetero-junction FEr 2.Qualification A serres of tests Qual ification tests consists of following rierns l)High 2)High The The test test temperature temperature conditions parameters DC Bias Reverse and were Test Bias ( H T p T ) Test are before ( H T R B T ) shown and in after Table the 1. sample size...