74F00
74F00 is Quad 2-Input NAND Gate manufactured by Fairchild Semiconductor.
Description
This device contains four independent gates, each of which performs the logic NAND function.
Ordering Code:
Order Number 74F00SC 74F00SJ 74F00PC Package Number M14A M14D N14A Package Description
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol
IEEE/IEC
Connection Diagram
Unit Loading/Fan Out
U.L. Pin Names An, Bn On Description
HIGH/LOW Inputs Outputs 1.0/1.0 50/33.3 Input IIH/IIL Output IOH/IOL 20 µA/- 0.6 m A
- 1 m A/20 m A
© 1999 Fairchild Semiconductor Corporation
DS009454
.fairchildsemi.
Absolute Maximum Ratings(Note 1)
Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output 3-STATE Output Current Applied to Output in LOW State (Max) ESD Last Passing Voltage (Min) twice the rated IOL (m A) 4000V
- 0.5V to VCC
- 0.5V to +5.5V
- 65 °C to +150°C
- 55 °C to +125°C
- 55 °C to +150°C
- 0.5V to +7.0V
- 0.5V to +7.0V
- 30 m A to +5.0 m A
Remended Operating Conditions
Free Air Ambient Temperature Supply Voltage 0°C to +70°C +4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol VIH VIL VCD VOH VOL IIH IBVI ICEX VID IOD IIL IOS ICCH ICCL Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test Output Leakage...