IDT71V3577S_79S, IDT71V3577SA_79SA, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
A0-A17 Address Inputs I N/A Synchronous Address inputs. The address register is triggered by a combi-nation of the rising edge of CLK
and ADSC Low or ADSP Low and CE Low.
LOW Synchronous Address Status from Cache Controller. ADSC is an active LOW input that is used to load the
address registers with new addresses.
I LOW Synchronous Address Status from Processor. ADSP is an active LOW input that is used to load the address
registers with new addresses. ADSP is gated by CE.
I LOW Synchronous Address Advance. ADV is an active LOW input that is used to advance the internal burst counter,
controlling burst access after the initial address is loaded. When the input is HIGH the burst counter is not
incremented; that is, there is no address advance.
Byte Write Enable
LOW Synchronous byte write enable gates the byte write inputs BW1-BW4. If BWE is LOW at the rising edge of CLK
then BWx inputs are passed to the next stage in the circuit. If BWE is HIGH then the byte write inputs are
blocked and only GW can initiate a write cycle.
I LOW Synchronous byte write enables. BW1 controls I/O0-7, I/OP1, BW2 controls I/O8-15, I/OP2, etc. Any active byte
write causes all outputs to be disabled.
I LOW Synchronous chip enable. CE is used with CS0 and CS1 to enable the IDT71V3577/79. CE also gates ADSP.
I N/A This is the clock input. All timing references for the device are made with respect to this input.
Chip Select 0
I HIGH Synchronous active HIGH chip select. CS0 is used with CE and CS1 to enable the chip.
Chip Select 1
I LOW Synchronous active LOW chip select. CS1 is used with CE and CS0 to enable the chip.
I LOW Synchronous global write enable. This input will write all four 9-bit data bytes when LOW on the rising edge of
CLK. GW supersedes individual byte write enables.
N/A Synchronous data inp ut/output (I/O) pins. The data input path is registered, triggered by the rising edge of
CLK. The data o utput path is flow-through (no output register).
Linear Burst Order
LOW Asynchronous b urst order selection input. When LBO is HIGH, the inter-leaved burst sequence is selected.
When LBO is LOW the Linear burst sequence is selected. LBO is a static input and must not change state
while the device is operating.
I LOW Asynchronous output enable. When OE is LOW the data output drivers are enabled on the I/O pins if the chip
is also selected. When OE is HIGH the I/O pins are in a high-impedance state.
N/A Gives input command for TAP controller. Sampled on rising edge of TDK. This pin has an internal pullup.
Test Data Input
Serial input of registers placed between TDI and TDO. Sampled on rising edge of TCK. This pin has an
Clock input of TAP co ntroller. Each TAP event is clocked. Test inputs are captured on rising edge of TCK,
while test outputs are driven from the falling edge of TCK. This pin has an internal pullup.
Serial output of registers placed be tween TDI and TDO. This output is active depending on the state of the
Optional Asynchronous JTAG rese t. Can be used to reset the TAP contro ller, but not required. JTAG reset
I LOW occurs automatically at power up and also resets using TMS and TCK per IEEE 1149.1. If not used TRST can
be left floating. This pin has an internal pullup. Only available in BGA package.
Asynchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the IDT71V3577/79 to
I HIGH its lowest power consumption level. Data retention is guaranteed in Sleep Mode.This pin has an internal pull
VDD Power Supply N/A N/A 3.3V core power supply.
VDDQ Power Supply N/A N/A 3.3V I/O Supply.
N/A N/A Ground.
N/A N/A NC pins are not electrically connected to the device.
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
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