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IFN3956 - Dual Matched N-Channel JFET

Download the IFN3956 datasheet PDF. This datasheet also covers the IFN3954 variant, as both devices belong to the same dual matched n-channel jfet family and are provided as variant models within a single manufacturer datasheet.

Description

The -50V InterFET IFN3954, IFN3955, and IFN3956 matched pair JFET’s are targeted for high input impedance applications for mid to high frequency designs.

Gate leakages are typically 10pA at room temperatures.

Parts are matched down to 5mV.

Features

  • InterFET N0016H Geometry.
  • Typical Noise: 6 nV/√Hz.
  • Low Ciss: 3.5pF Typical.
  • High Input Impedance.
  • RoHS Compliant.
  • SMT, TH, and Bare Die Package options.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (IFN3954-InterFET.pdf) that lists specifications for multiple related part numbers.

Datasheet Details

Part number IFN3956
Manufacturer InterFET
File Size 369.12 KB
Description Dual Matched N-Channel JFET
Datasheet download datasheet IFN3956 Datasheet

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
InterFET Product Folder Technical Support Order Now IFN3954-5-6 IFN3954, IFN3955, IFN3956 Dual Matched N-Channel JFET Features • InterFET N0016H Geometry • Typical Noise: 6 nV/√Hz • Low Ciss: 3.5pF Typical • High Input Impedance • RoHS Compliant • SMT, TH, and Bare Die Package options. Applications • Differential Amplifiers • Low Noise Pre-Amplifier • High Impedance Amplifier Description The -50V InterFET IFN3954, IFN3955, and IFN3956 matched pair JFET’s are targeted for high input impedance applications for mid to high frequency designs. Gate leakages are typically 10pA at room temperatures. Parts are matched down to 5mV. The TO-71 package is hermetically sealed and suitable for military applications. Custom specifications, matching, and packaging options are available.
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