n n n n n n n n n n Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermeticall.

These devices have been characterized for Single Event Effects (SEE) with useful performance up to an LET of 80 (MeV/(m.

N-CHANNEL POWER MOSFET

IRHNA53064

IRHNA53160

IRHNA53Z60

IRHNA54064

IRHNA54160

IRHNA54260

IRHNA54Z60

IRHNA57064

IRHNA57160

IRHNA57260

IRHNA57Z60

IRHNA58064

IRHNA58160

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