n n n n n n n n n Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Simple Drive Requirements Ease of Paralleling Hermetically Sealed Surface M.

These devices have been characterized for Single Event Effects (SEE) with useful performance up to an LET of 80 (MeV/(m.

IRHNJ58034

IRHNJ58230

IRHNJ58Z30

IRHNJ53034

IRHNJ53130

IRHNJ53230

IRHNJ53Z30

IRHNJ54034

IRHNJ54130

IRHNJ54230

IRHNJ54Z30

IRHNJ57034

IRHNJ57130