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ACS00MS - Radiation Hardened Quad 2-Input NAND Gate

Description

The Intersil ACS00MS is a Radiation Hardened quad 2-Input NAND gate.

A high logic level on both inputs forces the output to a logic low state.

The ACS00MS utilizes advanced CMOS/SOS technology to achieve high-speed operation.

Features

  • 1.25 Micron Radiation Hardened SOS CMOS.
  • Total Dose 300K RAD (Si).
  • Single Event Upset (SEU) Immunity 80 MEV-cm2/mg.
  • Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse.
  • Latch-Up Free Under Any Conditions.
  • Military Temperature Range: -55oC to +125oC.
  • Significant Power Reduction Compared to ALSTTL Logic.
  • DC Operating Voltage Range: 4.5V to 5.5V.
  • Input Logic Levels.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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TM ACS00MS April 1995 Radiation Hardened Quad 2-Input NAND Gate Features • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose 300K RAD (Si) • Single Event Upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ) • SEU LET Threshold >80 MEV-cm2/mg • Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Conditions • Military Temperature Range: -55oC to +125oC • Significant Power Reduction Compared to ALSTTL Logic • DC Operating Voltage Range: 4.5V to 5.5V • Input Logic Levels - VIL = 30% of VCC Max - VIH = 70% of VCC Min • Input Current ≤1µA at VOL, VOH Description The Intersil ACS00MS is a Radiation Hardened quad 2-Input NAND gate. A high logic level on both inputs forces the output to a logic low state.
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