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ACS00MS Datasheet

Radiation Hardened Quad 2-Input NAND Gate

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TM ACS00MS
April 1995
Radiation Hardened
Quad 2-Input NAND Gate
Features
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose 300K RAD (Si)
• Single Event Upset (SEU) Immunity
<1 x 10-10 Errors/Bit-Day (Typ)
• SEU LET Threshold >80 MEV-cm2/mg
• Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current 1µA at VOL, VOH
Description
The Intersil ACS00MS is a Radiation Hardened quad 2-Input
NAND gate. A high logic level on both inputs forces the output
to a logic low state.
The ACS00MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of radi-
ation hardened, high-speed, CMOS/SOS Logic Family.
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE
MIL-STD-1835 DESIGNATOR, CDIP2-T14, LEAD FINISH C
TOP VIEW
A1 1
B1 2
Y1 3
A2 4
B2 5
Y2 6
GND 7
14 VCC
13 B4
12 A4
11 Y4
10 B3
9 A3
8 Y3
14 LEAD CERAMIC FLAT PACK
MIL-STD-1835 DESIGNATOR, CDFP3-F14, LEAD FINISH C
TOP VIEW
A1
B1
Y1
A2
B2
Y2
GND
1 14
2 13
3 12
4 11
5 10
69
78
VCC
B4
A4
Y4
B3
A3
Y3
Ordering Information
PART NUMBER
ACS00DMSR
ACS00KMSR
ACS00D/Sample
ACS00K/Sample
ACS00HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
14 Lead SBDIP
14 Lead Ceramic Flatpack
14 Lead SBDIP
14 Lead Ceramic Flatpack
Die
Truth Table
Functional Diagram
INPUTS
OUTPUT
An Bn Yn
L LH
L HH
HLH
HH L
NOTE: L = Logic Level Low, H = Logic Level High
An
Bn
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
1
Yn
Spec Number 518813
FN 3563.1


Intersil Electronic Components Datasheet

ACS00MS Datasheet

Radiation Hardened Quad 2-Input NAND Gate

No Preview Available !

Specifications ACS00MS
Absolute Maximum Ratings
Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . ±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . . ±50mA
Storage Temperature Range (TSTG). . . . . . . . . . . -65oC to +150oC
Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . +265oC
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
(All Voltages Reference to VSS)
Thermal Impedance
θJA
DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74oC/W
Flatpack . . . . . . . . . . . . . . . . . . . . . . . . . . 116oC/W
Maximum Package Power Dissipation at +125oC
θJC
24oC/W
30oC/W
DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.7W
Flatpack . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.4W
Maximum Device Power Dissipation. . . . . . . . . . . . . . . . . . . (TBD)W
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Supply Voltage Range . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Time at 4.5V VCC (TR, TF) . . . . . . .10ns/ V Max
Operating Temperature Range. . . . . . . . . . . . . . . . -55oC to +125oC
Input High Voltage. . . . . . . . . . . . . . . . . . . . . . . VCC to 70% of VCC
Input Low Voltage . . . . . . . . . . . . . . . . . . . . . . . . .0V to 30% of VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETERS
Supply Current
SYMBOL
(NOTE 1)
CONDITIONS
ICC VCC = 5.5V,
VIN = VCC or GND
Output Current
(Source)
Output Current
(Sink)
Output Voltage High
Output Voltage Low
Input Leakage
Current
IOH
IOL
VOH
VOL
IIN
VCC = 4.5V, VIH = 4.5V,
VOUT = VCC -0.4V,
VIL = 0V, (Note 2)
VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V,
(Note 2)
VCC = 5.5V, VIH = 3.85V,
VIL = 1.65V, IOH = -50µA
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = -50µA
VCC = 5.5V, VIH = 3.85V,
VIL = 1.65V, IOL = 50µA
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOL = 50µA
VCC = 5.5V, VIN = VCC or
GND
Noise Immunity
Functional Test
FN VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, (Note 3)
GROUP
A SUB-
GROUPS
1
2, 3
1
2, 3
1
2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1
2, 3
7, 8A, 8B
LIMITS
TEMPERATURE
MIN MAX
+25oC
-5
+125oC, -55oC
- 100
+25oC
-12 -
+125oC, -55oC
-8 -
+25oC
12 -
+125oC, -55oC
8-
+25oC, +125oC, -55oC VCC -0.1 -
+25oC, +125oC, -55oC VCC -0.1 -
+25oC, +125oC, -55oC
-
0.1
+25oC, +125oC, -55oC
-
0.1
+25oC
+125oC, -55oC
+25oC, +125oC, -55oC
-
-
-
±0.5
±1.0
-
UNITS
µA
µA
mA
mA
mA
mA
V
V
V
V
µA
µA
V
NOTES:
1. All voltages reference to device GND.
2. Force/measure functions may be interchanged.
3. For functional tests, VO 4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.
Spec Number 518813
2


Part Number ACS00MS
Description Radiation Hardened Quad 2-Input NAND Gate
Maker Intersil Corporation
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