UPD78P064 Overview
U10105EJ4V1UM00 (4th edition) Date Published November 1999 N CP(K) © Printed in Japan 1993 [MEMO] .. User’s Manual U10105EJ4V1UM00 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation.
