74ABT10 Datasheet | NXP Semiconductors

DESCRIPTION PIN NUMBER 1, 2, 3, 4, 5, 9, 10, 11, 13 6, 8, 12 7 14 SYMBOL An, Bn, Cn Yn GND VCC NAME AND FUNCTION Data inputs Data outputs Ground (0V) Positive supply voltage An L L L 1 A0 2 B0 13 C0 A1 B1 C1 A2 B2 VCC = Pin 14 GND = Pin 7 C2 3 4 5 9 10 11 8 Y2 6 Y1 12 Y0 SV00059 FUNCTION TABLE INPUTS Bn L L H H L L H H Cn L H L H L H L H OUTPUTS Yn H H H H H H H L LOGIC DIAGRAM L H H H H NOTES: H = High voltage level L = Low voltage level SA00348 ORDERING INFORMATION PACKAGES 14-Pin Plastic DIP 14-Pin plastic SO 14-Pin Plastic SSOP Type II 14-Pin Plastic TSSOP Type I 1995 Sep 22 TEMPERATURE RANGE - 40°C to +85°C - 40°C to +85°C - 40°C to +85°C - 40°C to +85°C 2 OUTSIDE NORTH AMERICA 74ABT10 N 74ABT10 D 74ABT10 DB 74ABT10 PW NORTH AMERICA 74ABT10 N 74ABT10 D 74ABT10 DB 74ABT10PW DH DWG NUMBER SOT27-1 SOT108-1 SOT337-1 SOT402-1 853-1810 15793 Philips Semiconductors Product specification Triple 3-input NAND gate ABSOLUTE MAXIMUM RATINGS1, 2 SYMBOL VCC IIK VI IOK VOUT IOUT Tstg PARAMETER DC supply voltage DC input diode current DC input voltage3 DC output diode current DC output voltage3 DC output current Storage temperature range VO < 0 output in Off or High state output in Low state VI < 0 CONDITIONS RATING - 0.5 to +7.0 - 18 - 1.2 to +7.0 - 50 - 0.5 to +5.5 40 - 65 to 150 UNIT V m A V m A V m A °C NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “remended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C. 3. The input and output voltage ratings may...