Overview: NXP Semiconductors Technical Data RF Power LDMOS Transistors
High Ruggedness N--Channel Enhancement--Mode Lateral MOSFETs RF power transistors designed for both narrowband and broadband ISM, broadcast and aerospace applications operating at frequencies from 1.8 to 2000 MHz. These devices are fabricated using NXP’s enhanced ruggedness platform and are suitable for use in applications where high VSWRs are encountered. Typical Performance: VDD = 50 Volts Frequency (MHz) Signal Type Pout (W) 1.8 to 30 (2,6) Two--Tone (10 kHz spacing) 25 PEP 30--512 (3,6) Two--Tone (200 kHz spacing) 25 PEP 512 (4) Pulse (100 sec, 20% Duty Cycle) 25 Peak 512 (4) CW 25 1030 (5) CW 25 Gps (dB) 25
17.1
25.4
25.5 22.5 D (%) 51
30.1
74.5
74.7 60 IMD (1) (dBc) --30
--32
—
— — Load Mismatch/Ruggedness Frequency (MHz) Signal Type VSWR 30 (2) CW >65:1 at all Phase Angles 512 (3) CW 512 (4) 512 (4) Pulse (100 sec, 20%
Duty Cycle)
CW 1030 (5) CW Pin (W)
0.23 (3 dB Overdrive)
1.6 (3 dB Overdrive)
0.14 Peak (3 dB
Overdrive)
0.14 (3 dB Overdrive
0.34 (3 dB Overdrive Test Voltage
50 Result
No Device Degradation 1. Distortion products are referenced to one of two tones. See p. 13, 20. 2. Measured in 1.8--30 MHz broadband reference circuit. 3. Measured in 30--512 MHz broadband reference circuit. 4. Measured in 512 MHz narrowband test circuit. 5. Measured in 1030 MHz narrowband test circuit. 6. The values shown are the minimum measured performance numbers across the in-
dicated frequency range.