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KAF-50100 Datasheet

CCD IMAGE SENSOR

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KAF-50100
8176 (H) x 6132 (V) Full
Frame CCD Image Sensor
Description
The KAF−50100 Image Sensor is a high performance,
50-megapixel CCD. Based on the TRUESENSE 6.0 micron Full
Frame CCD Platform, the sensor features ultra-high resolution, broad
dynamic range, and a four-output architecture. A lateral overflow
drain suppresses image blooming, while an integrated Pulse Flush
Gate clears residual charge on the sensor with a single electrical pulse.
A Fast Dump Gate can be used to selectively remove a line of charge
to facilitate partial image readout. The sensor also utilizes the
TRUESENSE Transparent Gate Electrode to improve sensitivity
compared to the use of a standard front side illuminated polysilicon
electrode.
The sensor shares a common pin-out and electrical configuration
with the KAF−40000 Image Sensor, allowing a single camera design
to support both members of this sensor family.
Table 1. GENERAL SPECIFICATIONS
Parameter
Typical Value
Architecture
Total Number of Pixels
Number of Effective Pixels
Number of Active Pixels
Pixel Size
Active Image Size
Full Frame CCD (Square Pixels)
8304 (H) × 6220 (V) = 51.6 Mp
8208 (H) × 6164 (V) = 50.5 Mp
8176 (H) × 6132 (V) = 50.1 Mp
6.0 mm (H) × 6.0 mm (V)
49.1 mm (H) × 36.8 mm (V)
61.3 mm (Diagonal),
645 1.1x Optical Format
Aspect Ratio
4:3
Horizontal Outputs
Saturation Signal
Output Sensitivity
Quantum Efficiency
KAF−50100−CAA
KAF−50100−AAA
KAF−50100−ABA (with Lens)
Read Noise (f = 18 MHz)
Dark Signal (T = 60°C)
Dark Current Doubling Temperature
Dynamic Range (f = 18 MHz)
4
40.3 ke
31 mV/e
22%, 22%, 16% (Peak R, G, B)
25%
62%
12.5 e
42 pA/cm2
5.7°C
70.2 dB
Estimated Linear Dynamic Range
(f = 18 MHz)
69.3 dB
Charge Transfer Efficiency
Horizontal
Vertical
0.999995
0.999999
Blooming Protection
(4 ms Exposure Time)
800X Saturation Exposure
Maximum Date Rate
18 MHz
Package
Ceramic PGA
Cover Glass
MAR Coated, 2 Sides
NOTE: All Parameters are specified at T = 40°C unless otherwise noted.
© Semiconductor Components Industries, LLC, 2015
April, 2015 − Rev. 3
1
www.onsemi.com
Figure 1. KAF−50100 Full Frame CCD
Image Sensor
Features
TRUESENSE Transparent Gate Electrode
for High Sensitivity
Ultra-High Resolution
Board Dynamic Range
Low Noise Architecture
Large Active Imaging Area
Applications
Digitization
Mapping/Aerial
Photography
Scientific
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
Publication Order Number:
KAF−50100/D


  ON Semiconductor Electronic Components Datasheet  

KAF-50100 Datasheet

CCD IMAGE SENSOR

No Preview Available !

KAF−50100
ORDERING INFORMATION
Table 2. ORDERING INFORMATION
Part Number
Description
KAF−50100−CAA−JD−AA
Color (Bayer RGB), No Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Standard Grade
KAF−50100−CAA−JD−AE
Color (Bayer RGB), No Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Engineering Grade
KAF−50100−AAA−JD−BA
Monochrome, No Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Standard Grade
KAF−50100−AAA−JD−AE
Monochrome, No Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Engineering Grade
KAF−50100−ABA−JR−BA
Monochrome, Microlens, Enhanced, ESD, Ceramic PGA,
Taped-Clear Cover Glass with AR Coating (Both Sides), Standard Grade
KAF−50100−ABA−JR−AE
Monochrome, Microlens, Enhanced, ESD, Ceramic PGA,
Taped-Clear Cover Glass with AR Coating (Both Sides), Engineering Grade
Marking Code
KAF−50100−CAA
Serial Number
KAF−50100−AAA
Serial Number
KAF−50100−ABA
Serial Number
See the ON Semiconductor Device Nomenclature document (TND310/D) for a full description of the naming convention
used for image sensors. For reference documentation, including information on evaluation kits, please visit our web site at
www.onsemi.com.
www.onsemi.com
2


Part Number KAF-50100
Description CCD IMAGE SENSOR
Maker ON Semiconductor
Total Page 25 Pages
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