OCTAL TRANSPARENT DĆTYPE LATCHES
WITH 3ĆSTATE OUTPUTS
SCLS455C − FEBRUARY 2001 − REVISED MAY 2004
D 4.5-V to 5.5-V VCC Operation
D Wide Operating Temperature Range of
−55°C to 125°C
D Balanced Propagation Delays and
D Standard Outputs Drive Up To 10 LS-TTL
D Significant Power Reduction Compared to
LS-TTL Logic ICs
D Inputs Are TTL-Voltage Compatible
The ’HCT573 devices are octal transparent
D-type latches. When the latch-enable (LE) input
is high, the Q outputs follow the data (D) inputs.
When LE is low, the Q outputs are latched at the
logic levels of the D inputs.
CD54HCT573 . . . F PACKAGE
CD74HCT573 . . . DB, E, OR M PACKAGE
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high
or low) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines
significantly. The high-impedance state and increased drive provide the capability to drive bus lines without
interface or pullup components.
OE does not affect the internal operations of the latches. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
PDIP − E Tube
SSOP − DB Tape and reel CD74HCT573DBR HK573
−55°C to 125°C
SOIC − M
Tape and reel
CDIP − F Tube
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design
guidelines are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright 2004, Texas Instruments Incorporated
On products compliant to MILĆPRFĆ38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.